Surface Analysis Equipments

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TOF-SIMS

PRODUCT

M6

High lateral resolution (< 50 nm) with the new Nanoprobe 50
Mass resolution > 30,000
Unmatched dynamic range and detection limits
Improved performance in delayed extraction mode : > 9,000 mass resolution and 2x higher transmission
TOF MS/MS with CID fragmentation for molecular structure elucidation
New flexible, push-button, closed-loop sample heating and cooling system for long-term operation without user interaction
Sophisticated SurfaceLab 7 software including fully integrated Multivariate Statistical Analysis (MVSA) software package

Application